• 专利标题:   Method for reducing graphene material and contact resistance of metal interconnection structure, involves providing structure using multi-layer graphene in contact area of graphene material and metal using single-layer graphene.
  • 专利号:   CN103296065-A
  • 发明人:   JIN Z, CHEN J, MA P, PENG S, WANG X
  • 专利权人:   INST MICROELECTRONICS CHINESE ACAD SCI
  • 国际专利分类:   H01L029/08, H01L029/10, H01L029/16
  • 专利详细信息:   CN103296065-A 11 Sep 2013 H01L-029/10 201377 Pages: 7 Chinese
  • 申请详细信息:   CN103296065-A CN10226207 07 Jun 2013
  • 优先权号:   CN10226207

▎ 摘  要

NOVELTY - The method involves providing structure using multi-layer graphene in contact area of the graphene material (13,14) and metal using single-layer graphene (12) in channel region. The multilayer graphene is provided to contact the contact region with the metal or metal electrodes (15,16), layer number of multi-layer graphene is varied between 2 to 10 layers. The metal is made of titanium and gold, chromium and gold, button and gold, nickel and gold or platinum and gold. USE - Method for reducing graphene material and contact resistance of metal interconnection structure. ADVANTAGE - The graphene material and metal contact resistance of the structure are reduced, so as to reduce the graphene and metal resistor. Since the single layer graphene is used as channel material, the mobility carrier of graphene is ensured. The graphene FET device current is increased and transconductance and cut-off frequency of the device can be improved by improving the graphene FET asymmetry of the device. DESCRIPTION OF DRAWING(S) - The drawing shows a cross-sectional view of the graphene material and metal contact resistance structure. Semiconductor substrate (10) Insulating layer (11) Single-layer graphene in channel region (12) Graphene materials (13,14) Metal electrodes (15,16)