• 专利标题:   System for testing internal resistance of capacitance bioelectrode used for brain-machine interface, has electroencephalogram collecting module that is provided for collecting electrophysiological signal, and impedance testing module that is provided for realizing impedance real-time test.
  • 专利号:   WO2023087397-A1, CN116138762-A
  • 发明人:   YANG L, ZHANG Y, WU J, WANG X, GAN L, LIU X, ZHENG H, LIANG D
  • 专利权人:   SHENZHEN INST ADVANCED TECHNOLOGY, SHENZHEN INST ADVANCED TECHNOLOGY
  • 国际专利分类:   A61B005/24, A61B005/0533, A61B005/28, A61B005/291, A61B005/296
  • 专利详细信息:   WO2023087397-A1 25 May 2023 A61B-005/24 202345 Pages: 19 Chinese
  • 申请详细信息:   WO2023087397-A1 WOCN134686 01 Dec 2021
  • 优先权号:   CN11386166

▎ 摘  要

NOVELTY - The capacitive bio-electrode internal resistance testing system has a conductive layer (110), dielectric layer (120), composite layer (130), electroencephalogram acquisition module (140) and impedance test module (150). The conductive layer is arranged on the surface of the dielectric layer. The dielectric layer is in contact with a skin surface (100). The composite layer is arranged between the dielectric layer and the skin surface. An electroencephalogram acquisition module is electrically connected with the conductive layer. The electroencephalogram acquisition module is used for collecting electrophysiological signals. Two ends of impedance test module are electrically connected with the conductive layer and the composite layer respectively. The impedance test module is used for realizing real-time impedance test. USE - System for testing internal resistance capacitive bio-electrode used for brain-machine interface and artificial intelligence emerging fields. ADVANTAGE - By using the structural design of the composite layer, the internal resistance of electrode is monitored by using impedance technology, such that the real time measurement of electroencephalogram impedance is realized, thus, testing the service performance of an electrode. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a test method of the capacitance bioelectrode internal resistance test system. DESCRIPTION OF DRAWING(S) - The drawing shows a structure schematic diagram of the capacitor bioelectrode internal resistance test system. (Drawing includes non-English language text) 100Skin surface 110Conductive layer 120Dielectric layer 130Composite layer 140Electroencephalogram acquisition module 150Impedance test module