• 专利标题:   Detecting impurity elements and their contents in graphene oxide comprises e.g. using glow discharge mass spectrometry to detect each element and its content in high-purity aluminum powder, and grinding.
  • 专利号:   CN111351833-A
  • 发明人:   LU N, WANG X, YANG X, LU K, XIAO L, ZHANG L, DING J, ZHONG X
  • 专利权人:   XINJIANG XIJIN GRAPHENE TECHNOLOGY CO
  • 国际专利分类:   G01N027/68
  • 专利详细信息:   CN111351833-A 30 Jun 2020 G01N-027/68 202058 Pages: 20 Chinese
  • 申请详细信息:   CN111351833-A CN10167124 11 Mar 2020
  • 优先权号:   CN10167124

▎ 摘  要

NOVELTY - Detecting impurity elements and their contents in graphene oxide comprises (i) using glow discharge mass spectrometry to detect each element and its content in high-purity aluminum powder, (ii) grinding, adding high-purity aluminum powder and grinding after drying and pre-treating the graphene oxide, uniformly mixing to obtain the sample, where the high-purity aluminum powder and the high-purity aluminum powder detected in the step (i) are the same sample taken from the same batch of high-purity aluminum powder, but have not been detected, and (iii) detecting the sample by the glow discharge mass spectrometry in the step (i) to obtain detection data, and obtaining the impurity elements and their contents in graphene oxide through analysis. USE - The method is useful for detecting impurity elements and their contents in graphene oxide. ADVANTAGE - The method: uses doping method; incorporates graphene oxide into high-purity aluminum powder for glow discharge mass spectrometry (GDMS) detection, and pre-treats the sample; makes it easier to be diffused into the plasma by sputtering; and solves problem of large detection error caused by the poor detection limit of C/O elements by GDMS.