• 专利标题:   Interconnect structure for electronic device, comprises first dielectric layer including trench, conductive wire filling inside of trench, first cap layer on top surface of conductive wire, first cap layer including doped graphene, and doped graphene being graphene doped with group fifth element.
  • 专利号:   US2023130702-A1, KR2023059054-A
  • 发明人:   JUNG A, KIM S, SHIN K, SHIN K W, KIM S T, JUNG A R
  • 专利权人:   SAMSUNG ELECTRONICS CO LTD, SAMSUNG ELECTRONICS CO LTD
  • 国际专利分类:   H01L023/532, H01L021/768, C01B032/182, H01L021/02
  • 专利详细信息:   US2023130702-A1 27 Apr 2023 H01L-023/532 202336 English
  • 申请详细信息:   US2023130702-A1 US959812 04 Oct 2022
  • 优先权号:   KR143080

▎ 摘  要

NOVELTY - Interconnect structure (100) comprises a first dielectric layer (120) including a trench (120a), a conductive wire (140) filling an inside of the trench, a first cap layer (150) on a top surface of the conductive wire, the first cap layer including a doped graphene, the doped graphene being graphene doped with a group (V) element, and a second dielectric layer on a top surface of first cap layer. USE - Interconnect structure for electronic device (claimed). ADVANTAGE - The interconnect structure may form the cap layer formed in the conductive wire with the doped graphene, thus reducing the resistance of the conductive wire and improves adhesion to a subsequent deposition material layer formed on the cap layer. DESCRIPTION OF DRAWING(S) - The drawing shows a cross-sectional view of interconnect structure. 100Interconnect structure 120First dielectric layer 120aTrench 140Conductive wire 150First cap layer