• 专利标题:   Semiconductor device structure such as vertical field effect transistor (VFET) structure, has graphene having thickness of one atom adjacent insulator material and spans entirety of height and width of insulator material.
  • 专利号:   US2016276454-A1, US10002935-B2
  • 发明人:   SANDHU G S
  • 专利权人:   MICRON TECHNOLOGY INC, MICRON TECHNOLOGY INC
  • 国际专利分类:   H01L029/24, H01L029/40, H01L029/423, H01L029/49, H01L029/66, H01L029/786, H01L029/772, H01L027/105, B82Y010/00, H01L029/78, H01L021/8234, H01L027/12
  • 专利详细信息:   US2016276454-A1 22 Sep 2016 H01L-029/49 201668 Pages: 13 English
  • 申请详细信息:   US2016276454-A1 US167765 27 May 2016
  • 优先权号:   US215968, US167765

▎ 摘  要

NOVELTY - The structure has an insulator material on a vertical sidewall of a mesa on a substrate (50). The insulator material spans an entirety of a height and a width of the vertical sidewall of the mesa. A graphene has a thickness of one atom adjacent the insulator material. The graphene spans an entirety of a height and a width of the insulator material. The graphene is directly adjacent the insulator material. The another insulator material on another vertical sidewall of the mesa spans an entirety of a height and a width of the another vertical sidewall of the mesa. USE - Semiconductor device structure such as vertical field effect transistor (VFET) structure. ADVANTAGE - The channel region allows current to flow between a source region and a drain region. The re-filled material can be configured to withstand, without deformation, higher fabrication temperatures than the metal seeds could withstand. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are included for the following: (1) semiconductor device; and (2) method of forming a semiconductor device. DESCRIPTION OF DRAWING(S) - The drawing shows a top and front perspective view of semiconductor device structure. Substrate (50) Metal seed (110) Gate conductor (150) First gate insulator (160) Second insulator material (180)