• 专利标题:   Method for reducing metal and graphene contact resistance in graphene FET device, involves providing insulating substrate with metal layer, and evaporating thin metal layer for performing detects treatment process on graphene material layer.
  • 专利号:   CN105957807-A
  • 发明人:   JIN Z, MAO D, PENG S, WANG S, SHI J, ZHANG D
  • 专利权人:   INST MICROELECTRONICS CHINESE ACAD SCI
  • 国际专利分类:   H01L021/28, H01L021/336, H01L029/417, H01L029/78
  • 专利详细信息:   CN105957807-A 21 Sep 2016 H01L-021/28 201671 Pages: 7 Chinese
  • 申请详细信息:   CN105957807-A CN10304232 10 May 2016
  • 优先权号:   CN10304232

▎ 摘  要

NOVELTY - The method involves providing an insulating substrate with a graphene material layer and a metal layer. A source terminal and a drain terminal of a graphene FET device are arranged with a graphene material layer. A thin metal layer is evaporated for performing detects treatment process on the graphene material layer by a metal layer mask. Thickness of the metal layer mask is measured for about a 3-8 nm. The metal layer mask is made by metal palladium, nickel, titanium, or chromium materials. The source and drain terminals of the graphene FET device are made by metal material. USE - Method for reducing a metal-graphene contact resistance of a graphene FET device (claimed). ADVANTAGE - The method enables performing detect treatment process so as to increase end-contact area of a conductive channel, thus reducing metal and graphene contact resistance, and hence increasing on-state current and cut-off frequency of the graphene FET device. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a graphene FET device. DESCRIPTION OF DRAWING(S) - The drawing shows a front view of a graphene FET device.