• 专利标题:   Method for preparing super-resolution photo etching structure involves sequentially depositing metal layer on silicon-containing anti-reflection coating, and coating photosensitive layer to obtain super-resistance photoetch structure.
  • 专利号:   CN115472492-A
  • 发明人:   ZHAO Z, MU S, LIU K, LUO Y, GU Y, LUO X
  • 专利权人:   CHINESE ACAD SCI OPTICS ELECTRONICS IN
  • 国际专利分类:   H01L021/033, H01L021/311
  • 专利详细信息:   CN115472492-A 13 Dec 2022 H01L-021/033 202204 Chinese
  • 申请详细信息:   CN115472492-A CN11147820 20 Sep 2022
  • 优先权号:   CN11147820

▎ 摘  要

NOVELTY - Method for preparing super-resolution photo etching structure involves forming a dielectric layer (2) on the substrate (1), depositing a graphene oxide layer on the medium layer, baking and annealing the oxidation graphene layer to form a reduction oxidation graphene film layer (3), coating a silicon-containing anti-reflection coating on the reduction-oxidation graphene film layer, sequentially depositing the metal layer (5) on a Si-containing antireflection coating, and coating the photosensitive layer (6) to obtain the super-resolved photosensitive structure. USE - Method for preparing super-resolution photo etching structure. ADVANTAGE - The method improves the etching selection ratio between the reducing oxidation graphene film layer and the medium layer, avoids the problem of pattern collapse caused by over-high aspect ratio in the super-resolution photoetching image transmission, and the deformation. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a method for transferring pattern of the super-resolution photo etching structure. DESCRIPTION OF DRAWING(S) - The drawing shows a flowchart illustrating the method for transferring pattern of the super-resolution photo etching structure. 1Substrate 2Underlying dielectric layer 3Reduction-oxidation graphene thin film layer 4Etched si-containing anti-reflection coating 5Depositing metal layer 6Preparing photosensitive layer