• 专利标题:   Graphene composite used for electron microscopic observation, comprises graphene layer and support layer located on surface of graphene layer.
  • 专利号:   WO2020116990-A1, KR2020069414-A
  • 发明人:   LEE J O, JEONG D W, HWANG J Y, LEE K E, EUN L
  • 专利权人:   KOREA RES INST CHEM TECHNOLOGY, KOREA INST SCI TECHNOLOGY
  • 国际专利分类:   C01B032/194, G02B021/26, H01J037/20
  • 专利详细信息:   WO2020116990-A1 11 Jun 2020 C01B-032/194 202052 Pages: 26
  • 申请详细信息:   WO2020116990-A1 WOKR017192 06 Dec 2019
  • 优先权号:   KR155894

▎ 摘  要

NOVELTY - Graphene composite comprises a graphene layer and a support layer located on one surface of the graphene layer. USE - The composite is useful for electron microscopic observation. ADVANTAGE - The composite allows an accurate and clear observation of a specimen to be observed, and accurately and clearly observes an insulating bio specimen, and even a specimen that cannot be mounted on a sole graphene layer is stably mounted on the graphene composite due to the chemical transparency of graphene. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a method for manufacturing an electron microscope sample substrate, involving forming a crystalline sample on the other side of the graphene layer of the composite.