• 专利标题:   Graphene modulated high-k metal gate germanium-based MOS device manufacturing method, involves forming graphene thin film on Germanium-based substrate, and forming high-k gate dielectric on surface metal electrode.
  • 专利号:   CN103208425-A, WO2014146528-A1, CN103208425-B, US2016005609-A1, US9601337-B2
  • 发明人:   DI Z, WANG G, WANG X, ZHANG M, ZHENG X
  • 专利权人:   CHINESE ACAD SCI SHANGHAI MICROSYSTEM, SHANGHAI INST MICROSYSTEM INFORMATION
  • 国际专利分类:   H01L021/336, H01L021/02, H01L021/265, H01L021/28, H01L021/285, H01L021/324, H01L021/66, H01L029/16, H01L029/51, H01L029/66, H01L029/423, H01L029/778, H01L029/78
  • 专利详细信息:   CN103208425-A 17 Jul 2013 H01L-021/336 201372 Pages: 11 Chinese
  • 申请详细信息:   CN103208425-A CN10095306 22 Mar 2013
  • 优先权号:   CN10095306

▎ 摘  要

NOVELTY - The method involves forming a graphene thin film on a germanium (Ge)-based substrate. The graphene thin film is formed with a graphite alkene insulating thin layer. A fluorinated graphene surface is formed with an atomic layer and matched with a graphite fluoride dilute surface fragrance k gate medium. A high-k gate dielectric is formed on a surface metal electrode. A part of the surface metal electrode and the high-k gate dielectric are removed from the graphene thin film. A MOS device is provided with source and drain regions. The graphene thin film is extended toward a metal substrate. USE - Graphene modulated high-k metal gate germanium-based MOS device manufacturing method. ADVANTAGE - The method enables improving product quality, insulator quality and electrical performance of graphene modulated high-k metal gate germanium-based MOS device. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of a graphene modulated high-k metal gate germanium-based MOS device.