• 专利标题:   Pellicle for extreme ultraviolet lithography, comprises pellicle portion that is provided with central layer, where central layer is formed on pellicle frame and multiple capping layers are formed outside central layer.
  • 专利号:   KR2022017134-A
  • 发明人:   SHIN C, LEE C, HONG J H, YUN J W, PARK C G, LEESEUNGJO, KIM J, LEE H
  • 专利权人:   S S TECH CO LTD
  • 国际专利分类:   G03F001/22, G03F001/62
  • 专利详细信息:   KR2022017134-A 11 Feb 2022 G03F-001/62 202217 Pages: 15
  • 申请详细信息:   KR2022017134-A KR097255 04 Aug 2020
  • 优先权号:   KR097255

▎ 摘  要

NOVELTY - Pellicle (100) comprises a central layer (110) formed on a pellicle frame, and capping layers (130) formed outside the central layer, where at least some of the capping layers have a different radiation spectrum than the rest. USE - Pellicle for extreme ultraviolet lithography. ADVANTAGE - The pellicle has improved thermal stability, and minimizes loss of optical properties. DESCRIPTION OF DRAWING(S) - The drawing shows a cross-sectional view of a pellicle. Pellicle (100) Central layer (110) Lower layer (111) Upper layer (112) Capping Layer (130)