• 专利标题:   Determining number of graphene layers involves determining relative intensity of substrate-bound Raman-active mode in graphene-covered region to intensity of substrate-bound Raman-active mode in graphene-free region.
  • 专利号:   PL437678-A1
  • 发明人:   DOBROWOLSKI A, JAGIELLO J, CIUK T
  • 专利权人:   SIEC BADAWCZA LUKASIEWICZINST INZYNIERI
  • 国际专利分类:   B82Y035/00, C01B032/182, G01N021/65
  • 专利详细信息:   PL437678-A1 24 Oct 2022 G01N-021/65 202308 Pages: 1
  • 申请详细信息:   PL437678-A1 PL437678 23 Apr 2021
  • 优先权号:   PL437678

▎ 摘  要

NOVELTY - Method for determining number of graphene layers using Raman spectroscopy involves determining relative intensity of substrate-bound Raman-active mode in graphene-covered region to intensity of the substrate-bound Raman-active mode in graphene-free region in the backscatter mode with a visible light of 500-750 nm, and determining the number of graphene layers (n) using the equation. USE - Method for determining number of graphene layers. DETAILED DESCRIPTION - Method for determining number of graphene layers using Raman spectroscopy involves measuring relative intensity of substrate-bound Raman-active mode in graphene-covered region to intensity of the substrate-bound Raman-active mode in graphene-free region in the backscatter mode with a visible light of 500-750 nm, and determining the number of graphene layers (n) using the equation: I=(1-(0.023± 0.001))2nx 100%. An INDEPENDENT CLAIM is included for system for determining the number of graphene layers, which comprises a confocal microscope system with a neodymium-doped yttrium aluminum garnet laser and a charge coupled device (CCD) detector and a computing unit connected to the microscope system and detector.