• 专利标题:   Non-volatility resistance alteration memory device, has upper electrode arranged on active insulating layer, and oxide graphene multi-layer doped with oxide graphene layer and laminated with non-metal.
  • 专利号:   KR2017134128-A, KR1822433-B1
  • 发明人:   KIM D H, PARK C, RANI A, KIM R H
  • 专利权人:   UNIV EWHA IND COLLABORATION FOUND
  • 国际专利分类:   H01L045/00
  • 专利详细信息:   KR2017134128-A 06 Dec 2017 H01L-045/00 201808 Pages: 32
  • 申请详细信息:   KR2017134128-A KR065944 27 May 2016
  • 优先权号:   KR065944

▎ 摘  要

NOVELTY - The device (202) has a bottom electrode (102) formed on a specific material (101). An active insulating layer (103) includes an oxide graphene multi-layer on the bottom electrode. An upper electrode (104) is arranged on an active insulating layer. The oxide graphene multi-layer is doped with an oxide graphene layer (105) and laminated with non-metal, where the non-metal is selected from a group consisting of combinations of 16 group and periodic table 15 group, nitrogen or sulfur, and the oxide graphene layer includes negative charge and the non-metal includes positive charge. USE - Non-volatility resistance alteration memory device. ADVANTAGE - The device can be manufactured based on multi-component system so as to improve switching characteristic of non-volatility anode, reliability and stability of the device and reduce retention time of the device. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a method for manufacturing a non-volatility resistance alteration memory device. DESCRIPTION OF DRAWING(S) - The drawing shows a cross-sectional view of a non-volatility resistance alteration memory device. Specific material (101) Bottom electrode (102) Active insulating layer (103) Upper electrode (104) Oxide graphene layer (105) Non-volatility resistance alteration memory device (202)