• 专利标题:   Method for performing nanometer-scale microscopy on sample, involves providing sample to imaging system comprising graphene layer and exciting graphene plasmons in graphene layer as illumination source for imaging sample.
  • 专利号:   US2017003223-A1, US10317342-B2
  • 发明人:   ZUBAIRY M S, ALAMRI M D, ZENG X
  • 专利权人:   UNIV TEXAS A M SYSTEM, UNIV TEXAS A M SYSTEM, NAT CENT APPLIED PHYSICS KACST
  • 国际专利分类:   G01N021/64, G02B021/06, G02B021/16, G02B021/36, G02B021/00
  • 专利详细信息:   US2017003223-A1 05 Jan 2017 G01N-021/64 201706 Pages: 16 English
  • 申请详细信息:   US2017003223-A1 US200178 01 Jul 2016
  • 优先权号:   US188710P, US200178

▎ 摘  要

NOVELTY - The method involves providing a sample to an imaging system comprising a graphene layer, where the sample is disposed over the graphene layer. The graphene plasmons are excited in the graphene layer as an illumination source for imaging the sample. The image of the sample is captured using the graphene plasmons as the illumination source. The imaging system is provided with a dielectric layer disposed on the graphene layer. The sample is disposed between the graphene layer and the lens. The imaging system is provided with a substrate, on which the graphene layer is disposed. USE - Method for performing nanometer-scale microscopy on a sample. ADVANTAGE - The method involves providing a sample to an imaging system comprising a graphene layer, where the sample is disposed over the graphene layer, and thus enables improving efficiency for light-matter interactions, strong optical nonlinearity and unusual surface plasmons to maximize the quality of the resulting image. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a system for performing nanometer-scale microscopy on a sample. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic sectional view of a nanometer-scale microscopy performing system.