• 专利标题:   Layer structure for use in electronic device e.g. memory device, has insulating layer for covering outside surface of diffusion barrier and conductive material layer, where edge of barrier layer is aligned with edge of material layer.
  • 专利号:   US2021327817-A1
  • 发明人:   LEE J, SHIN H, PARK S, CHO Y, NAM S, SONG H
  • 专利权人:   SAMSUNG ELECTRONICS CO LTD
  • 国际专利分类:   H01L023/522, H01L021/768, H01L023/532
  • 专利详细信息:   US2021327817-A1 21 Oct 2021 H01L-023/532 202195 English
  • 申请详细信息:   US2021327817-A1 US362308 29 Jun 2021
  • 优先权号:   KR023540

▎ 摘  要

NOVELTY - The structure has a diffusion barrier layer (76) formed on a first material layer. A conductive material layer is formed on the diffusion barrier layer. An insulating layer covers an outside surface of the diffusion barrier and the material layers. The diffusion barrier layer includes a nanocrystalline graphene (nc-G) layer including a size of less than 100 nm and a ratio (D/G) of D-band to G-band that is greater than 1, and a 2-dimensional (2D)/G of 2D band to G band that is less than 1. An edge of the diffusion barrier layer is aligned with an edge of the conductive material layer. USE - Layer structure for use in an electronic device e.g. memory device or logic device. ADVANTAGE - The layer structure has a diffusion barrier layer that reduces resistance increment according to a critical dimension reduction and prevents an unnecessary material from diffusing into peripheral regions. DESCRIPTION OF DRAWING(S) - The drawing shows a cross-sectional view of the layer structure. Lower layer (70) Hole (74) Diffusion barrier layers (76, 80, 90, 100) Intermediate layer (88) Interlayer insulating layer (92)