• 专利标题:   Semiconductor device comprises second level wiring which is disposed at second metal level higher than first metal level, and includes second via connected to first line wiring, and second line wiring connected to second via.
  • 专利号:   US2022013467-A1, KR2022007984-A, CN113937088-A, TW202218087-A
  • 发明人:   LEE H B, KIM W D, LEE M J, LEE J E, LEEMINJOO, LI X, JIN W, LI M, LI J
  • 专利权人:   SAMSUNG ELECTRONICS CO LTD, SAMSUNG ELECTRONICS CO LTD
  • 国际专利分类:   H01L023/522, H01L023/528, H01L023/532, H01L021/02, H01L021/768
  • 专利详细信息:   US2022013467-A1 13 Jan 2022 H01L-023/532 202208 English
  • 申请详细信息:   US2022013467-A1 US358752 25 Jun 2021
  • 优先权号:   KR085970

▎ 摘  要

NOVELTY - Semiconductor device comprises a first level wiring 110 disposed at a first metal level, and including a first line wiring, a first insulating capping film, and a first side wall graphene film 141, an interlayer insulating film 190 which covers the side wall of the first line and capping films, and a second level wiring 210 at a second metal level higher than the first level. The second wiring includes a second via 225 connected to the first and second line wirings, respectively, where the second via penetrates the first capping layer. The first line is made of ruthenium. USE - Semiconductor device. ADVANTAGE - The semiconductor device is capable of improving the performance and reliability of a device by forming a protective film on a wiring line. DESCRIPTION OF DRAWING(S) - The drawing shows the schematic view of a diagram for explaining a semiconductor device. First level wiring (110) First side wall graphene film (141) First interlayer insulating film (190) Second level wiring (210) Second via (225)