• 专利标题:   Preparing nitride epitaxial structure comprises forming silicon carbide film on the surface of substrate, converting surface layer area of the silicon carbide film to form graphene layer and growing nitride single crystal on surface of graphene layer to form nitride epitaxial structure.
  • 专利号:   CN116053120-A
  • 发明人:   XU K, WANG J, XU J, XU Y, WANG Y
  • 专利权人:   CHINESE ACAD SCI SUZHOU NANOTECH NANO
  • 国际专利分类:   H01L021/205, H01L029/778
  • 专利详细信息:   CN116053120-A 02 May 2023 H01L-021/205 202347 Chinese
  • 申请详细信息:   CN116053120-A CN10327920 30 Mar 2023
  • 优先权号:   CN10327920

▎ 摘  要

NOVELTY - Preparing nitride epitaxial structure comprises forming a silicon carbide film on the surface of the substrate, converting the surface layer area of the silicon carbide film to form a graphene layer and growing a nitride single crystal on the surface of the graphene layer to form a nitride epitaxial structure. USE - The method is useful for preparing nitride epitaxial structure. ADVANTAGE - The method can epitaxial high quality single crystal gallium nitride on the single crystal or polycrystalline substrate, and improves the radiating performance of the gallium-nitride-based HEMT device. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are included for: Nitride epitaxial structure; and Gallium nitride-based high electron mobility transistor (HEMT) device. DESCRIPTION OF DRAWING(S) - The drawing shows a flow chart of preparing nitride epitaxial structure (Drawing includes non-English language text).