• 专利标题:   Controllable industrial graphene metal nano-meter structure array preparation method, involves forming platform frame with groove, and reducing temperature of segregation carbon metal solid solution for complete graphene preparation process.
  • 专利号:   CN103204455-A, CN103204455-B
  • 发明人:   CHEN L, DI Z, WANG G, WANG X, WEI X, ZHANG M
  • 专利权人:   CHINESE ACAD SCI SHANGHAI MICROSYSTEM, CHINESE ACAD SCI SHANGHAI MICROSYSTEM INFORMATION INST
  • 国际专利分类:   B81C001/00
  • 专利详细信息:   CN103204455-A 17 Jul 2013 B81C-001/00 201373 Pages: 9 Chinese
  • 申请详细信息:   CN103204455-A CN10008150 12 Jan 2012
  • 优先权号:   CN10008150

▎ 摘  要

NOVELTY - The method involves providing a top silicon layer with a SOI substrate. The SOI substrate is provided with a crystal orientation part. A rear surface of the top silicon layer is etched. A surface of the top silicon layer is exposed by an insulating layer. A platform frame is formed with a groove. A surface of the platform frame is provided with a graphene segregation unit. Temperature of a segregation carbon metal solid solution is reduced for complete graphene preparation process. A metal nano-particle is formed as nickel Nano particles or copper Nano particles. USE - Controllable industrial graphene metal nano-meter structure array preparation method. ADVANTAGE - The method enables preparing graphene array with high controllability and reliability, realizing distribution array graphene bonding process with high precision silicon small angle, general semiconductor preparation process in a convenient manner and graphene metal nano-meter structure array preparation process in a simple manner, and providing obvious effect. DETAILED DESCRIPTION - Thickness of the top silicon layer is about 5nm. DESCRIPTION OF DRAWING(S) - The drawing shows a sectional view of a controllable industrial graphene metal nano-meter structure array.