• 专利标题:   Graphene FET device manufacturing method, involves depositing passivation protection layer using selective etching of passivation protecting layer above grid medium layer, and depositing metal forming source on drain metal electrode.
  • 专利号:   CN104362092-A
  • 发明人:   JIN Z, MA P, WANG X, ZHANG D, WANG S, SHI J
  • 专利权人:   INST MICROELECTRONICS CHINESE ACAD SCI
  • 国际专利分类:   H01L021/28, H01L021/336
  • 专利详细信息:   CN104362092-A 18 Feb 2015 H01L-021/336 201526 Pages: 8 Chinese
  • 申请详细信息:   CN104362092-A CN10535591 11 Oct 2014
  • 优先权号:   CN10535591

▎ 摘  要

NOVELTY - The method involves depositing a grid medium layer and a grid metal electrode in a graphene. A passivation protection layer is deposited using selective etching of the passivation protecting layer above the grid medium layer. A gate metal electrode side wall, a passivation protection layer part and grid medium layer are provided to a corrosion process. A gate metal cover is removed from the grid medium layer. A metal forming source is deposited on a drain metal electrode. USE - Graphene FET device manufacturing method. ADVANTAGE - The method enables reducing a distance between the gate source and gate drain so as to reduce parasitic resistance path to increase graphene top gate FET device performance. DESCRIPTION OF DRAWING(S) - The drawing shows a flowchart illustrating a graphene FET device manufacturing method. '(Drawing includes non-English language text)'