• 专利标题:   Method for obtaining graphene oxide-coated p-type silicon wafer, involves cleaning substrate, wetting substrate, coating substrate with graphene oxide, forming reduction film from graphene oxide, and depositing contacts on substrate.
  • 专利号:   BR102016011644-A2
  • 发明人:   WANG S H, BERNARDO LENZ E SILVA G, SPARVOLI DE MEDEIROS M, PINHEIRO DA SILVA M F
  • 专利权人:   UNIV SAO PAULO USP
  • 国际专利分类:   H01L021/02
  • 专利详细信息:   BR102016011644-A2 05 Dec 2017 H01L-021/02 201830 Pages: 27 English
  • 申请详细信息:   BR102016011644-A2 BR10011644 23 May 2016
  • 优先权号:   BR10011644

▎ 摘  要

NOVELTY - The method involves preparing graphene oxide. A substrate is cleaned. The substrate is wetted. The substrate is coated with the graphene oxide for forming a coating film. A reduction film is formed on the substrate from the graphene oxide in an oven at temperature of 150-220 degree Celsius for 20-45 minutes. Contacts are deposited on the substrate. The graphene oxide is mixed with hydrochloric acid solution. The graphene oxide is retained in a filter, where the graphene oxide is washed with distilled water. USE - Method for obtaining reduced graphene oxide-coated substrates i.e. graphene oxide-coated p-type silicon wafer (claimed). ADVANTAGE - The method enables obtaining the graphene oxide-coated substrates in a cost-effective manner. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a device for obtaining reduced graphene oxide-coated substrates.