▎ 摘　　要

NOVELTY - Characteristic study of graphene using Raman spectroscopy, comprises analyzing the solid oxide graphene using known infrared spectroscopy (FT-IR) and photoelectron spectroscopy (XPS) to verify that the solid oxide graphene is correctly formed. The atomic force microscopy (AFM) images can be verified by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) only for the analysis of characteristic peaks of Raman spectroscopy. USE - The method is useful for characteristic study of graphene using Raman spectroscopy (claimed).