• 专利标题:   Homogeneous epitaxial high electron mobility transistor device structure comprises substrate, low-temperature nucleation layer, graphene layers, buffer layers, recovery layer, high resistance layer, channel layer and barrier layer.
  • 专利号:   CN111584627-A
  • 发明人:   WU Y, WANG Q, WANG D, CHEN X, YAN W, LU J, GE L, HE D, ZENG W, WANG J, MU P, CAO Y, CUI A, YUAN K, CHEN J, ZHANG J
  • 专利权人:   XIDIANWUHU RES INST
  • 国际专利分类:   H01L021/336, H01L029/06, H01L029/778
  • 专利详细信息:   CN111584627-A 25 Aug 2020 H01L-029/778 202078 Pages: 7 Chinese
  • 申请详细信息:   CN111584627-A CN10465630 28 May 2020
  • 优先权号:   CN10465630

▎ 摘  要

NOVELTY - A homogeneous epitaxial high electron mobility transistor (HEMT) device structure comprises, from bottom to top, a substrate, a low-temperature nucleation layer, a graphene layer (A), a buffer layer (A), a recovery layer, a graphene layer (B), a buffer layer (B), a high resistance layer, a channel layer and a barrier layer. USE - The homogeneous epitaxial HEMT device structure is useful for high-voltage and high-power electronic device. ADVANTAGE - The homogeneous epitaxial HEMT device structure: greatly reduces the dislocation density of the material; improves the quality of the crystal lattice, thus improving electron mobility, breakdown voltage, leakage current and other characteristics of the HEMT device; effectively alleviates the thermal mismatch between the sapphire and the gallium nitride layer; increases the utilization rate of the sapphire substrate and the gallium nitride film substrate; and is easy to peel by inserting the graphene layer.