• 专利标题:   Vertical variable resistance memory device has pillar structure that is extended in first direction on substrate and penetrating gate electrodes and first insulating patterns, and variable resistance pattern that is formed on sidewall of vertical electrode.
  • 专利号:   KR2022012626-A, CN113972234-A
  • 发明人:   KIM H C, KIM Y, SEO H W, RYU S, LEE K H, HONG J, LI J, YU S, XU H, JIN R, KIM H
  • 专利权人:   SAMSUNG ELECTRONICS CO LTD
  • 国际专利分类:   G11C013/00, H01L045/00, H01L027/24
  • 专利详细信息:   KR2022012626-A 04 Feb 2022 H01L-045/00 202220 Pages: 23
  • 申请详细信息:   KR2022012626-A KR091631 23 Jul 2020
  • 优先权号:   KR091631

▎ 摘  要

NOVELTY - The resistance memory device has gate electrodes spaced apart from each other on substrate in direction perpendicular to upper surface of the substrate. The insulating patterns are respectively formed between the gate electrodes, and include boron nitride. A pillar structure is extended in the direction on the substrate, and penetrates gate electrodes and the insulating patterns. The pillar structure includes vertical electrode includes graphene. A variable resistance pattern is formed on sidewall of the vertical electrode. USE - Vertical variable resistance memory device. ADVANTAGE - The difficulty of the process of forming the vertical electrode is reduced. The mobility of electrons is improved. The degree of integration of the vertical variable resistance memory device is improved, since the gate electrode formed between the insulating patterns including graphene and boron nitride has a low resistance. DESCRIPTION OF DRAWING(S) - The drawing shows a cross-sectional view of vertical variable resistance memory device. Substrate (100) First insulating pattern (115) Gate electrodes (125) Interlayer insulating film (130) First contact plug (200)