• 专利标题:   X-ray analysis equipment for analyzing pole microscopic thickness, has detecting apparatus which detects X-ray irradiated from graphene sample that is penetrated inside of chamber.
  • 专利号:   KR1538037-B1
  • 发明人:   SEUNG H H
  • 专利权人:   KOREA INST CERAMIC ENG TECHNOLOGY
  • 国际专利分类:   G01N001/36, G01N001/44, G01N023/00, G01N023/02, G01N023/20
  • 专利详细信息:   KR1538037-B1 21 Jul 2015 G01N-023/00 201553 Pages: 24
  • 申请详细信息:   KR1538037-B1 KR066946 02 Jun 2014
  • 优先权号:   KR066946

▎ 摘  要

NOVELTY - The equipment has collimated beam X-ray irradiation equipment which is arranged to irradiate the X-ray in inside of a chamber in which the graphene is laid. A detecting apparatus detects the X-ray irradiated from the graphene sample that is penetrated inside of the chamber. The graphene sample is arranged in order to center-rotate with the X-Y-Z shaft in the longitudinal and transverse direction in the inside of the chamber. USE - X-ray analysis equipment used for analyzing pole microscopic thickness. ADVANTAGE - The diversity and the certainty of the graphene product can be improved. The reliability insurance and the product competitiveness of the finished product can be improved. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for an X-ray analysis method. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of the X-ray analysis equipment. (Drawing includes non-English language text)