• 专利标题:   System for analyzing data based on principle and quantum oscillation test, has extremum curve visualization unit that uses slice-to-slice orbit matching algorithm in supercell k-space extremal area finder (SKEAF) to output extremum curve diagram to double verify and filter out problem of repetition.
  • 专利号:   CN115795266-A
  • 发明人:   CAO L, LV Y, ZHOU J, LIU G
  • 专利权人:   UNIV NANJING
  • 国际专利分类:   G06F017/16, G06F017/18
  • 专利详细信息:   CN115795266-A 14 Mar 2023 G06F-017/18 202325 Chinese
  • 申请详细信息:   CN115795266-A CN11526031 01 Dec 2022
  • 优先权号:   CN11526031

▎ 摘  要

NOVELTY - The system has a preprocessing module that includes an interpolation unit and a magnetic field direction conversion unit. An output module includes a calculation result unit, an extremal trajectory visualization unit, an extremal curve visualization unit, an extremal orbit section unit and a Fermi surface selection unit. The extremum trajectory visualization unit uses the marching cubes algorithm to present the Fermi surface in three dimensions, and accurately locate the position and shape of the extremum orbit. The extremum curve visualization unit uses a slice-to-slice orbit matching algorithm in SKEAF to output the extremum curve diagram of the Fermi surface to which the orbit belongs, so as to double verify and filter out the problem of repetition of extreme orbits due to calculation accuracy. USE - System for analyzing data based on principle and quantum oscillation test for measuring and drawing Fermi surface in condition of strong magnetic field, used in metal material research process. Can also be used in high temperature superconductor, graphene, topological material, quantum and exhibits electronic properties of charge density wave material. ADVANTAGE - The calculation efficiency for complex Fermi surface can be improved effectively. The quantum oscillation frequency and effective quality information of the related material can be determined quickly and accurately. The calculation redundancy problem under the structure symmetry can be effectively excluded. Thus, the calculation efficiency can be greatly improved. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for an analysis method based on the first principle and quantum oscillation test based on the system. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic diagram of a three-dimensional Fermi surface visual data analysis method based on the first principle calculation and quantum oscillation test . (Drawing includes non-English language text).