• 专利标题:   Analyzing graphene, comprises generating second graphene structure by oxidizing first graphene structure including graphene having grains and grain boundaries, and support portion, and detecting shape of the graphene.
  • 专利号:   US2013344611-A1, KR2013142794-A, US8945937-B2, KR1946007-B1
  • 发明人:   LEE Y, HAN G, DUONG D L, HAN G H, LEE Y H
  • 专利权人:   LEE Y, HAN G, DUONG D L, SAMSUNG ELECTRONICS CO LTD, UNIV SUNGKYUNKWAN RES BUSINESS FOUND, SAMSUNG ELECTRONICS CO LTD, UNIV SUNGKYUNKWAN RES BUSINESS FOUND
  • 国际专利分类:   C01B031/04, G01N021/17, C01B031/02, G01N021/33, G01N033/00, G01B011/24
  • 专利详细信息:   US2013344611-A1 26 Dec 2013 G01N-021/17 201403 Pages: 14 English
  • 申请详细信息:   US2013344611-A1 US904526 29 May 2013
  • 优先权号:   KR066320

▎ 摘  要

NOVELTY - Analyzing graphene: comprises providing a first graphene structure including, graphene having grains and grain boundaries, and a support portion for supporting the graphene; generating a second graphene structure by oxidizing first graphene structure; and detecting a shape of the graphene. USE - The method is useful for analyzing graphene (claimed) and as monitoring process in manufacturing. ADVANTAGE - The method is: carried by utilizing an apparatus that is manufactured simply; and performed over large area as well as local portion of the graphene, thus reducing time, cost and effort for analysis. The shape of grains of the graphene is observed with simple analysis tool. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are also included for: (1) an apparatus of analyzing the graphene structure comprising: an oxidization unit configured to receive the graphene structure including graphene and the support portion, and form oxides by oxidizing parts of the support portion corresponding to the grain boundaries of the graphene; and a graphene shape detection unit configured to detect a shape of the graphene; and (2) the graphene structure comprising: graphene; the support portion; and an oxide in a part of the support portion abutting the grain boundaries.