▎ 摘　　要

NOVELTY - The present invention provides a palladium-silver-copper alloy wire rod, which comprises palladium, silver, graphene copper, indium and inevitable impurities, wherein, based on the total weight of the palladium-silver-copper alloy wire rod, the content of palladium is 45 wt% to 50 wt%, the content of silver is 25 wt% to 30 wt%, the content of graphene copper is 22 wt% to 29.5 wt%, and the content of indium and unavoidable impurities is 0.4 wt% to 0.6 wt%. Based on the total weight of the graphene copper, the graphene content in the graphene copper is greater than or equal to 100 ppm and less than or equal to 350 ppm. Since the palladium-silver-copper alloy wire rod of the present invention contains a specific composition in a specific content, the probe made of it further has excellent wear resistance, and further application in wafer testing can effectively reduce the detection defect rate.