▎ 摘　　要

NOVELTY - Analyzing a target particle in a specimen involves (a) dispensing specimen into first1to firstncontainers configured to capture target particle, (b) removing a contaminant other than the target particle to be captured from the specimen, adding first to m-th probes to the first1to firstn containers, where first to m-th probes have at least a binding portion that specifically binds to one of first to m-th surface markers of target particle and a nucleic acid reporter portion including a common amplification sequence to which a common primer set binds and a specific amplification sequence to which a specific primer set binds and which is disposed in a region amplified by the common amplification sequence in which the binding portion and specific amplification sequence are different from each other between the first to m-th probes, and (c) removing excessive first to m-th probes that have not bound to the target particle. USE - Method for analyzing target particle in specimen. ADVANTAGE - The method analyzes target particle in specimen, which simultaneously and comprehensively analyzes type, amount and concentration of multiple target particles that is contained in a specimen. DETAILED DESCRIPTION - Analyzing a target particle in a specimen involves (a) dispensing specimen into first1 to firstn containers configured to capture target particle, (b) removing a contaminant other than the target particle to be captured from the specimen, adding first to m-th probes to the first1 to firstn containers, where first to m-th probes have at least a binding portion that specifically binds to one of first to m-th surface markers of target particle and a nucleic acid reporter portion including a common amplification sequence to which a common primer set binds and a specific amplification sequence to which a specific primer set binds and which is disposed in a region amplified by the common amplification sequence in which the binding portion and specific amplification sequence are different from each other between the first to m-th probes, (c) removing excessive first to m-th probes that have not bound to the target particle, (d) individually amplifying the reporter portion for each of the first1 to firstn containers by using the common primer set to obtain first to n-th amplification products (e) removing an excessive common primer set from first to n-th amplification products, (f) dispensing the first to n-th amplification products into second1 to secondm containers respectively, amplifying the amplification products in the second1 to secondm containers by using the first to m-th specific primer sets, respectively, and (g) analyzing presence or absence or types of the target particles captured in first1 to firstn containers by determining types of surface markers present in first1 to firstn containers from the presence or absence of amplification product by the specific primer set in the second1 to secondm containers, where n and m are integers of 2 or more. INDEPENDENT CLAIMS are included for: an analytical reagent for analyzing a target particle in a specimen comprises first to m-th probes; and an analyzer for analyzing a target particle in a specimen, comprises a first1 to firstn containers, a first dispensing unit that dispenses the specimen into the first1 to firstn containers, a reagent supply unit that supplies the first to m-th probes to the first1 to firstn containers, a cleaning unit that removes contaminants or excessive first to m-th probes from the first1 to firstn containers, a first amplification unit that amplifies a reporter portion, a second1 to secondm containers, a second dispensing unit that dispenses an amplification product into the second1 to secondm containers, a second amplification unit that amplifies the amplification product using a specific primer set, a detecting unit that detects the amplification product by the specific primer set in the second1 to secondm containers, and an analysis unit that analyzes the target particle from a detection result in the detecting unit.