• 专利标题:   Self-aligned graphene-based FET manufacturing method, involves forming photo-resist with photo-resist layer, forming gate electrode with photo-resist layer and gate structure, and generating source electrode and drain electrode.
  • 专利号:   CN107256888-A
  • 发明人:   JIN Z, HUANG X, YAO Y, PENG S, SHI J, ZHANG D
  • 专利权人:   INST MICROELECTRONICS CHINESE ACAD SCI
  • 国际专利分类:   H01L021/336, H01L029/16, H01L029/786
  • 专利详细信息:   CN107256888-A 17 Oct 2017 H01L-029/16 201776 Pages: 9 Chinese
  • 申请详细信息:   CN107256888-A CN10317603 08 May 2017
  • 优先权号:   CN10317603

▎ 摘  要

NOVELTY - The method involves forming a substrate with a graphene layer. A first photo-resist is formed with a self-alignment layer and the graphene layer. A second photo-resist is formed with the self-alignment layer. Central position of a slot is obtained. A source electrode is formed with a gate dielectric layer. A third photo-resist is formed with a photo-resist layer. The gate electrode is formed with the photo-resist layer and a gate structure. The source electrode and a drain electrode are generated. The first photo-resist and the second photo-resist are selected as a positive photo-resist. USE - Self-aligned graphene-based FET manufacturing method. ADVANTAGE - The method enables increasing performance of a graphene FET, stability and manufacturing efficiency. DESCRIPTION OF DRAWING(S) - The drawing shows a flow diagram illustrating a self-aligned graphene-based FET manufacturing method. '(Drawing includes non-English language text)'