• 专利标题:   Visualizing distribution and intrinsic orientation of periodically spaced one-dimensional structures by depositing electrically conductive solid film of imaging material onto surface of two-dimensional material, providing polarization microscope, and imaging layered composite at acquisition angles.
  • 专利号:   EP4079930-A1
  • 发明人:   AMADO E, KRESSLER J
  • 专利权人:   UNIV MARTIN LUTHER HALLEWITTENBERG
  • 国际专利分类:   C01B032/186, C23C014/06, C23C014/54, C23C016/26, C23C016/34, C23C016/52, G01N021/21, G01N021/84, G01Q060/60, G01Q070/12, G02B001/08, G02B005/30, G06T007/00
  • 专利详细信息:   EP4079930-A1 26 Oct 2022 C23C-016/26 202296 Pages: 23 English
  • 申请详细信息:   EP4079930-A1 EP169208 19 Apr 2021
  • 优先权号:   EP169208

▎ 摘  要

NOVELTY - Method for visualizing a distribution and an intrinsic orientation of periodically spaced one-dimensional structures by optical microscopy, where the periodically spaced one-dimensional structures are distributed inside a single domain or inside multiple domains on a two-dimensional material, inside each domain, the periodically spaced one-dimensional structures run essentially in parallel, where the distance between adjacent periodically spaced one-dimensional structures is in 50-1000 nm, preferably 250-500 nm, involves (a) depositing an electrically conductive solid film of an imaging material onto the surface of the two-dimensional material to obtain a layered composite, (b) providing a polarization microscope, (c) imaging the layered composite at acquisition angles by polarized optical microscopy using the polarization microscope, and (d) analyzing the images to determine the distribution and orientation of the periodically spaced one-dimensional structures inside the domains. USE - The method is useful for visualizing a distribution and an intrinsic orientation of periodically spaced one-dimensional structures by optical microscopy. ADVANTAGE - The method is non-destructive, and does not alter the two-dimensional material. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are included for the following: use of (SN)x deposited on a two-dimensional material such as graphene or hexagonal boron nitride, in polarized optical microscopy, in the above method; and a method of production of a two-dimensional material, graphene or hexagonal boron nitride, involving visualizing for controlling the quality of the two-dimensional material such as graphene or hexagonal boron nitride.