• 专利标题:   Selection device of resistive memory element, has two-dimensional insulating layer which is formed on graphene layer, and specific electrode that is formed on two dimensional insulating layer whose dielectric strength is set in preset value.
  • 专利号:   KR2020043721-A, KR2146419-B1
  • 发明人:   HEEJOONYANG, SUN L
  • 专利权人:   UNIV SUNGKYUNKWAN RES BUSINESS FOUND
  • 国际专利分类:   H01L021/31, H01L029/16, H01L045/00
  • 专利详细信息:   KR2020043721-A 28 Apr 2020 H01L-045/00 202047 Pages: 13
  • 申请详细信息:   KR2020043721-A KR124464 18 Oct 2018
  • 优先权号:   KR124464

▎ 摘  要

NOVELTY - The selection device has a graphene layer (200) that is formed on a substrate (100). A two-dimensional insulating layer (300) is formed on the graphene layer. A first electrode (400) is formed on the two-dimensional insulating layer. The dielectric strength of the two-dimensional insulating layer is 5 MV/cm or more. The thickness of the two-dimensional insulating layer is 5 nm to 30 nm. The thickness of the graphene layer is 10 nm or less. The current flashing ratio is 1010 or more. USE - Selection device of resistive memory element (claimed). ADVANTAGE - The leakage current is reduced by providing large current blink ratio, so that the power consumption of a resistive memory element is reduced. The selection element provides the best performance. The change in current according to the voltage change of the selection element is performed quickly. DESCRIPTION OF DRAWING(S) - The drawing shows a cross-sectional view of a selection device. Substrate (100) Oxide insulating layer (110) Graphene layer (200) Two-dimensional insulating layer (300) Electrode (400,500)