▎ 摘　　要

NOVELTY - The utility model claims a system for measuring surface emissivity and temperature graphene of PTC radiating device, comprising: a thermocouple (6), a temperature collecting instrument, an infrared thermal imager (3) and a computer (1); the temperature collecting instrument comprises a data collecting board card (5) and a temperature collecting instrument main machine (4); the thermocouple is connected with the data collecting plate card, for measuring the temperature of a certain position of the graphene of the PTC radiating device, the data collecting plate card is used for collecting the temperature data and transmitting the temperature value to the temperature collecting instrument host, the infrared thermal imager is used for measuring the surface temperature of the PTC radiating device for shooting the deposited graphene, and the infrared thermal imager is connected with the computer, the computer is provided with a conventional infrared thermal imager measuring software for controlling the infrared thermal imager and processing the information measured by the infrared thermal imager. The system test flow is simple, easy to operate, especially suitable for measuring the measured object without secondary damage and real-time measurement requirement.