• 专利标题:   Graphene absorption medium surface defect cavity photonic crystal refractive index sensor, has structure formed with cavity, where relationship between wavelength and refractive index is obtained to monitor tested sample refractive index.
  • 专利号:   CN106053390-A
  • 发明人:   CHEN Y, ZHAO Z, ZHU Q, LUO P, TIAN Y, LIU X
  • 专利权人:   UNIV YANSHAN
  • 国际专利分类:   G01N021/41, G02B006/122
  • 专利详细信息:   CN106053390-A 26 Oct 2016 G01N-021/41 201677 Pages: 9 Chinese
  • 申请详细信息:   CN106053390-A CN10470561 23 Jun 2016
  • 优先权号:   CN10470561

▎ 摘  要

NOVELTY - The sensor has a structure formed with a surface defect cavity. A periodic photonic crystal is formed with high refractive index material (A) and low refractive index material (B). The surface defect cavity is arranged with an absorbent medium graphene (C). A low index refraction material detects sample solution to be measured through a sensor surface, where a relationship between peak wavelength and a sample refractive index is obtained to monitor tested sample refractive index by detecting resonance peak wavelength shift. USE - Graphene absorption medium surface defect cavity photonic crystal refractive index sensor. ADVANTAGE - The sensor is introduced into a defect cavity absorption medium graphite to obtain resonance light signal, so that defects formed in the cavity is gradually absorbed in an efficient manner. DESCRIPTION OF DRAWING(S) - The drawing shows a sectional perspective view of a graphene absorption medium surface defect cavity photonic crystal refractive index sensor. High refractive index material (A) Low refractive index material (B) Absorbent medium graphene (C)