▎ 摘　　要

NOVELTY - The method involves forming a graphene layer in a substrate. A lower layer of the graphene layer is provided with a bulge part. Width and thickness of the graphene layer are determined. The substrate is coated with copper material. TEM sample is obtained. Width measuring point of the TEM sample is determined. Boundary of the TEM sample is obtained. Magnification and amplification rates of the TEM sample are calculated by using the measuring point, where thickness of the graphene layer is about 20-100 nanometer. USE - TEM sample magnification correcting method. ADVANTAGE - The method enables prolonging service life of the TEM sample and reducing correcting cost. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a TEM magnification correcting sample forming method. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view illustrating a TEM sample magnification correcting method.