▎ 摘　　要

NOVELTY - The utility model claims an integrated circuit board probe testing device with shielding structure, comprising a device shell and a rubber sleeve groove, the bottom of the device shell is provided with a bottom groove, and the inner side of the bottom groove is provided with a bracket; the bottom of the bracket is provided with a rubber pad, the left side of the device shell is provided with a support; and the front side of the support is provided with a crank; the top end outer side of the crank is provided with a rubber sleeve, the inner side of the support is provided with a rolling wheel; and the inner side of the rolling wheel is provided with a detecting wire; the top end of the detecting wire is provided with a detecting needle; and the outer side of the detecting needle is provided with an insulating sleeve; the inner side of the device shell is provided with a graphene shielding layer; and the inner part of the graphene shielding layer is provided with a test device mounting frame. The utility model is provided with a sealing structure formed between the graphene shielding layer and the inner wall of the device shell, so it can prevent other device or interference signal outside the device to interfere the device.