• 专利标题:   Resistance random memory device comprises upper electrode formed with graphene layer, and bottom electrode having oxide layer.
  • 专利号:   KR2012105771-A, KR1211011-B1
  • 发明人:   SANG H H, TAE L U
  • 专利权人:   KWANGJU INST SCI TECHNOLOGY, GWANGJU INST SCI TECHNOLOGY
  • 国际专利分类:   H01L021/8247, H01L027/115
  • 专利详细信息:   KR2012105771-A 26 Sep 2012 H01L-027/115 201270 Pages: 14
  • 申请详细信息:   KR2012105771-A KR023408 16 Mar 2011
  • 优先权号:   KR023408

▎ 摘  要

NOVELTY - Resistance random memory device comprises upper electrode formed with graphene layer; and bottom electrode having oxide layer. USE - Resistance random memory device. ADVANTAGE - The device has reduced area by using redox reaction between oxide layer and graphene layer. It has excellent high temperature retention. DESCRIPTION OF DRAWING(S) - The drawing is a schematic view of the device. Bottom electrode (10) Oxide layer (20) Graphene layer (30)