▎ 摘　　要

NOVELTY - The system has a doped graphene single-layer isolated by a buffer layer for forming a graphene/buffer layer stack. The graphene/buffer layer stack is arranged on a substrate. A to-be-tested sample is arranged between a lower surface of a high refractive index germanium prism and the graphene/buffer layer stack. A single-frequency terahertz emitter provides a TM polarized terahertz light. The lower surface of the germanium prism realizes evanescent with the to-be-tested sample. A refractive index sensor obtains dielectric parameter of the to-be-tested sample. USE - Doped graphene/buffer layer stack SPR sensing system. ADVANTAGE - The system utilizes doped graphene/buffer layer stack SPR sensing technology for realizing object refractive index detection so as to ensure structure is simple and improves operation efficiency in a convenient manner with high reliability. DESCRIPTION OF DRAWING(S) - The drawing shows a front view of a doped graphene/buffer layer stack SPR sensing system.