• 专利标题:   Air gap/graphene interconnection structure, has substrate provided with barrier layer that is fixed on dielectric layer, and upper layer graphite nano-belt lines isolated in dielectric layer through air gap.
  • 专利号:   CN102956611-A, CN102956611-B
  • 发明人:   LI M, ZENG S, ZUO Q
  • 专利权人:   SHANGHAI IC R D CENT CO LTD, SHANGHAI INTEGRATED CIRCUIT RES DEV CE
  • 国际专利分类:   H01L021/768, H01L023/522, H01L023/532
  • 专利详细信息:   CN102956611-A 06 Mar 2013 H01L-023/522 201339 Chinese
  • 申请详细信息:   CN102956611-A CN10449288 12 Nov 2012
  • 优先权号:   CN10449288

▎ 摘  要

NOVELTY - The structure has a substrate provided with a barrier layer. The barrier layer is fixed on a dielectric layer. The dielectric layer is provided with a porous medium layer. A porous dielectric layer is fixed on upper layer graphite nano-belt lines. A lower layer interconnection of a medium layer is formed to the porous medium layer. The upper layer graphite nano-belt lines are isolated in the dielectric layer through an air gap. A thickness of the upper-layer graphite nano-belt lines is less than 10nm. USE - Air gap/graphene interconnection structure. ADVANTAGE - The structure replaces traditional copper metal by the graphite nano-belt lines and simplifies the manufacturing process. The lower layer interconnection overlapping position is formed through the air gap, thus reducing coupling capacitance and resistor capacitor (RC) delay time in an effective manner, and hence improving chip performance. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for an air gap interconnect structure/graphene preparation method. DESCRIPTION OF DRAWING(S) - The drawing shows a partial sectional view of an air gap/graphene interconnection structure.