• 专利标题:   Method of forming graphene film on silicon carbide substrate for electronic device materials involves planarizing surface of silicon carbide single crystal, washing and annealing in vacuum.
  • 专利号:   JP2011230959-A, JP5644175-B2
  • 发明人:   YAMAUCHI K, HATTORI A, ARIMA K, SANO Y
  • 专利权人:   YAMAUCHI K
  • 国际专利分类:   C01B031/02, H01L021/306, H01L029/161
  • 专利详细信息:   JP2011230959-A 17 Nov 2011 C01B-031/02 201177 Pages: 19 Japanese
  • 申请详细信息:   JP2011230959-A JP102620 27 Apr 2010
  • 优先权号:   JP102620

▎ 摘  要

NOVELTY - Graphene film is formed on silicon carbide (SiC) substrate by planarizing surface of SiC single crystal to remove scratch and form a step-terrace structure, washing and annealing at 800-1100 degrees C for 1-10 minutes in vacuum to form graphene in SiC surface. The number of graphene layers is controlled by controlling the annealing process. USE - A method of forming graphene film on silicon carbide substrate for electronic device materials, such as metal transistor, wafer, chip, field-effect transistor, metal oxide semiconductor field-effect transistor and sensor. ADVANTAGE - The method produces high quality graphene film on silicon carbide substrate. Defects on surface are eliminated. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a SiC substrate which contains graphene produced by the method of forming graphene film on SiC substrate. DESCRIPTION OF DRAWING(S) - The drawing shows a graph demonstrating the temperature dependence of the CARE-SiC (0001) substrate, measured by Temperature Programmed Desorption (TPD).