• 专利标题:   Forming patterned layer of material involves providing substrate having layered structure, where layered structure comprises base layer, support layer, and thermally insulating layer.
  • 专利号:   RD686015-A
  • 发明人:  
  • 专利权人:   ANONYMOUS
  • 国际专利分类:   H01L000/00
  • 专利详细信息:   RD686015-A 10 Jun 2021 H01L-000/00 202152 Pages: 27 English
  • 申请详细信息:   RD686015-A RD686015 10 Jun 2021
  • 优先权号:   RD686015

▎ 摘  要

NOVELTY - Forming patterned layer of material involves providing a substrate having a layered structure, where the layered structure comprises a base layer, a support layer, and a thermally insulating layer. The thermally insulating layer has a lower thermal conductivity than the support layer, where the support layer comprises multiple sub-units that are thermally insulated from each other within a plane of the support layer. The selected portion of the support layer is selectively irradiated during a deposition process, where the irradiation locally drives the deposition process in the selected portion to form a layer of deposited material in a pattern defined by the selected portion. USE - Method for forming patterned layer of material. ADVANTAGE - The method forms the patterned layer of material in a simple, cost-effective and eco-friendly manner with improved heat retention in the support layer, and reduced rate of heat conduction away from the selected portion. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a method for forming a semiconductor device, which involves forming layer in the device.