• 专利标题:   Semiconductor structure for growing gallium nitride by graphene mask method, has graphene mask layer etched to expose region of substrate layer as window region, and gallium nitride layer covered on surface of graphene mask layer.
  • 专利号:   CN213071068-U
  • 发明人:   CHEN W, CAO B, XU L, LI L, YANG F
  • 专利权人:   UNIV SOOCHOW
  • 国际专利分类:   H01L021/02
  • 专利详细信息:   CN213071068-U 27 Apr 2021 H01L-021/02 202147 Pages: 9 Chinese
  • 申请详细信息:   CN213071068-U CN21109584 16 Jun 2020
  • 优先权号:   CN21109584

▎ 摘  要

NOVELTY - The utility model belongs to the field of semiconductor, claims a semiconductor structure for growing gallium nitride by graphene mask method, comprising a gallium nitride layer, a graphene mask layer; a substrate layer; the substrate layer is directly grown graphene mask layer by plasma enhanced chemical vapour deposition; the graphene mask layer forms a grating-shaped stripe by etching; the graphene mask layer grows the gallium nitride layer by metal organic chemical vapour deposition. Beneficial effects: graphene mask layer structure can effectively reduce the gallium nitride dislocation, improve the growth quality; Because the graphene is a two-dimensional material, which can reduce the low angle grain boundary defect caused by the mask layer; at the same time, the graphene has good radiating performance, so as to greatly improve the radiating performance of the gallium nitride device; The graphene mask layer and the gallium nitride layer are combined by weak Van der Waals force so that the gallium nitride layer is easy to peel off. The structure also can be applied to III-V group compound semiconductor except gallium nitride.