• 专利标题:   Method for fabricating semiconductor device, involves performing annealing process that serves to convert carbon-containing layer into graphene layer, after depositing metal layer.
  • 专利号:   US2017346010-A1, US9923142-B2
  • 发明人:   CHEN M, PAN S C, HSIEH C
  • 专利权人:   TAIWAN SEMICONDUCTOR MFG CO LTD, UNIV TAIWAN NAT, TAIWAN SEMICONDUCTOR MFG CO LTD, UNIV TAIWAN NAT
  • 国际专利分类:   H01L021/02, H01L029/06, H01L029/16, H01L029/66, H01L051/00, H01L051/05, B81C001/00
  • 专利详细信息:   US2017346010-A1 30 Nov 2017 H01L-051/00 201781 Pages: 23 English
  • 申请详细信息:   US2017346010-A1 US169557 31 May 2016
  • 优先权号:   US169557

▎ 摘  要

NOVELTY - The method (200) involves providing (202) a substrate that includes an insulating layer. A carbon-containing layer is formed (204) over insulating layer and includes a self-assembled monolayer with tridecafluoro-tetrahydrooctyl-trichlorosilane and dodecyltrichlorosilane. A metal layer is formed (206) over carbon-containing layer. An annealing process is performed (208) which serves to convert carbon-containing layer into a graphene layer. The metal layer includes Nickel, copper, platinum, iron, carbon monoxide, gold and copper-nickel alloy. USE - Method for fabricating semiconductor device such as graphene device. ADVANTAGE - The method used to provide large-area graphene using a transfer-free, direct growth process thus fabricates graphene devices with improved characteristics. The carbon nanotube has a controlled band gap is fabricated so as to ensure formation of an appropriate semiconducting carbon nanotube for subsequent transistor fabrication. The self-assembled monolayer (SAM) is deposited using a vapor phase deposition process that provides a highly conformal SAM with excellent step coverage on high-aspect ratio structures and facilitates SAM deposition onto surface topographies. DESCRIPTION OF DRAWING(S) - The drawing shows a flow chart illustrating for a method of fabricating a graphene device. Method for fabricating semiconductor device (200) Step for providing a substrate that includes an insulating layer (202) Step for forming carbon-containing layer over insulating layer (204) Step for forming metal layer over carbon-containing layer (206) Step for performing annealing process (208)