▎ 摘　　要

NOVELTY - The probe has a cantilever probe substrate, a needle tip and a needle tip surface that are provided with a conductive film. The conductive film is formed as graphene. A graphite alkene material is formed as single layer graphene. The conductive film is covered with the cantilever probe substrate and the needle tip. The needle tip and the conductive film are provided with a metal film. A conductive lead is connected with a direct current (DC) voltage source. The DC voltage source is arranged between a probe and a current meter. USE - Conductive atomic force microscope probe. ADVANTAGE - The probe has better conductivity, high electron mobility, low carrier injection, soft material and thermodynamic stability. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a probe measuring terahertz wave band non-porous needle tip near field optical detection method. DESCRIPTION OF DRAWING(S) - The drawing shows a front view of a conductive atomic force microscope probe.