• 专利标题:   Depositing thin film containing carbon by exposing substrate to precursor in chamber loaded with substrate, purging precursor in chamber exposed to precursor, exposing substrate to reactive plasma in chamber, and purging reactive plasma.
  • 专利号:   WO2021025314-A1, KR2021016804-A, KR2224128-B1
  • 发明人:   JEON H T, JUNG C W, LEE N G, KIM B U, SONG S H, PARK S H, KWON Y R, JEON H, LEE N, KIM B W, SEOKHWI S, PARKSUHYUN, KWONYULIM
  • 专利权人:   UNIV HANYANG IND COOP FOUND, UNIV HANYANG IUCFHYU
  • 国际专利分类:   H01L021/02, C23C016/26, C23C016/455
  • 专利详细信息:   WO2021025314-A1 11 Feb 2021 202117 Pages: 27
  • 申请详细信息:   WO2021025314-A1 WOKR009251 14 Jul 2020
  • 优先权号:   KR095034

▎ 摘  要

NOVELTY - Method for depositing a thin film containing carbon involves exposing the substrate to a precursor in a chamber loaded with a substrate, purging the precursor in a chamber exposed to the precursor, exposing the substrate to a reactive plasma in a chamber in which the precursor is purged, and purging the reactive plasma from the chamber exposed to reactive plasma, where the deposition cycle is repeatedly performed a predetermined number of times, and forming a carbon-containing thin film by carrying out a carbon-containing plasma treatment in the repeating process, in which the carbon content is adjusted to a predetermined ratio. USE - The method is useful for depositing a thin film containing carbon. ADVANTAGE - The method easily adjusts carbon content, and easily controls physical and chemical properties of thin film.