▎ 摘　　要

NOVELTY - The system has an analysis section (300) analyzing wrinkle direction of an atomic force microscope (AFM) tip (11). A determining unit (400) determines graphene wrinkle direction through a frictional force mapping image that indicates contrast of a domain. A measuring unit (100) measures a rotation angle of a measure point in an initial measurement spot based on a dividing process of a graphene sample (12). An output unit (200) controls contrast range of the graphene sample and outputs the frictional force mapping image. USE - AFM frictional force mapping based graphene domain measuring system i.e. optical microscope. ADVANTAGE - The system separates the graphene from an atom monolayer in an effective manner and reduces different structural defects, thus developing high quality graphene film in an effective manner. The system changes frictional force according to progressive direction of a contact unit, thus improving stability of the system. The system has better measuring speed and electrical structural features, and ensures better physical property of the graphene and satisfies working condition. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a graphene domain measuring method. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of an AFM frictional force mapping based graphene domain measuring system.'(Drawing includes non-English language text)' AFM tip (11) Graphene sample (12) Measuring unit (100) Output unit (200) Analysis section (300) Determining unit (400)