• 专利标题:   Depositing graphene barrier film, involves placing substrate containing the titanium thin film layer into substrate processing system chamber forming processing space, supplying first reaction gas into chamber, supplying second reaction gas, and forming graphene layer on titanium thin film layer.
  • 专利号:   CN115775767-A, US2023081962-A1, KR2023037082-A
  • 发明人:   PARK J, LI J, JIN D, SUN W, KIM T, YIN Y, TIAN Z, BAK H, PARK J H, LEE K J, KIM D W, SUN W H, KIM T S, YOON W J, JEON J H, PARK H K, PARK H, JEONJINHO, YUN W J, WOO K D, LEE K
  • 专利权人:   WONIK IPS CO LTD, WONIK IPS CO LTD
  • 国际专利分类:   H01L021/768, H01L023/532, C01B032/186, C23C016/26, H01L021/285
  • 专利详细信息:   CN115775767-A 10 Mar 2023 H01L-021/768 202327 Chinese
  • 申请详细信息:   CN115775767-A CN11082588 06 Sep 2022
  • 优先权号:   KR119637

▎ 摘  要

NOVELTY - Depositing graphene barrier film, comprises placing the substrate containing the titanium thin film layer into the substrate processing system chamber forming the processing space; supplying the first reaction gas into the chamber to guide the formation of crystal nuclei on the titanium thin film layer; and supplying second reaction gas into chamber, and forming graphene layer on the titanium thin film layer. USE - The method is useful for depositing graphene barrier film in contact structure (claimed) in semiconductor element. ADVANTAGE - The method enables forming a graphene barrier film for a semiconductor element, in particular forms a barrier film including a graphene layer, thus reducing the contact resistance of metal wiring. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a contact structure. DESCRIPTION OF DRAWING(S) - The drawing shows a flow chart of depositing graphene barrier film (Drawing includes non-English language text).