▎ 摘　　要

NOVELTY - The method involves configuring the terahertz vector network analyzer platform in the near-field test environment. The uniformity and crystalline quality of graphene film samples is measured. The uniformity of the graphene film sample is completed by the translational scan test. The crystalline quality of the graphene film sample is completed by the rotating polarization test. The graphene film sample is first fixed on the substrate translation table. The rectangular waveguide antenna is configured to irradiate graphene film samples in the test frequency band. USE - Quality inspection method for graphene films. ADVANTAGE - The method enables avoiding limitation of graphene film quality characterization by a Raman spectrum and an atomic force microscope.