• 专利标题:   Graphene sheet quality testing apparatus, has read station determining defect region existed in graphene sheet based on heat distribution exerciser that obtains heat distributed on graphene sheet, and Raman spectrum scattered from region.
  • 专利号:   KR2013099600-A
  • 发明人:   KWON K H, KIM N Y
  • 专利权人:   SAMSUNG TECHWIN CO LTD
  • 国际专利分类:   G01N021/65, G01N025/72
  • 专利详细信息:   KR2013099600-A 06 Sep 2013 G01N-025/72 201363 Pages: 18
  • 申请详细信息:   KR2013099600-A KR021231 29 Feb 2012
  • 优先权号:   KR021231

▎ 摘  要

NOVELTY - The apparatus has a Raman spectrometer measuring a case. A read station determines defect region existed in a graphene sheet based on a heat distribution exerciser that obtains heat distributed on the graphene sheet. A Raman spectrum is fixed in a laser beam that is formed in the defect region. The Raman spectrum is scattered from the defect region. The read station controls the Raman spectrometer. The heat distribution exerciser is provided with a current source that applies current to the graphene sheet. The Raman spectrometer is provided with a camera. USE - Graphene sheet quality testing apparatus. ADVANTAGE - The apparatus improves performance of the Raman spectrometer. The apparatus ensures that an objective lens can be changed according to general size of the defect region so as to improve performance of the graphene sheet in the case of the Raman spectrometer. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a graphene sheet quality testing method. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic block diagram of a graphene sheet quality testing apparatus.'(Drawing includes non-English language text)'