• 专利标题:   Graphene board inspecting apparatus has determination unit that is coupled to transmittance detecting unit, and receives and analyzes detected transmitance of light penetrating graphene board to determine state of graphene board.
  • 专利号:   US2013265567-A1, KR2013114552-A, KR2013114617-A, CN103364374-A, US9128050-B2, CN103364374-B, KR1776708-B1
  • 发明人:   WON D, WON D K, KWON K H, YUAN D
  • 专利权人:   SAMSUNG TECHWIN CO LTD, SAMSUNG TECHWIN CO LTD, HANWHA TECHWIN CO LTD
  • 国际专利分类:   G01B011/02, G01N021/59, G01N021/95, H05K013/08, G01B011/04, G01B011/14, G01N021/956
  • 专利详细信息:   US2013265567-A1 10 Oct 2013 G01N-021/59 201370 Pages: 17 English
  • 申请详细信息:   US2013265567-A1 US690051 30 Nov 2012
  • 优先权号:   KR036800, KR086942

▎ 摘  要

NOVELTY - The inspecting apparatus (101) has a light processing unit (110a) that emits at least one light on the graphene board (301) and any received light penetrating the graphene board is converted to an output signal. A transmittance detecting unit (121) then receives the output signal and inspect transmittance of the light penetrating the graphene board. A determination unit (131) coupled to the transmitance detecting unit, receives and analyzes the detected transmitance to determine state of the graphene board. USE - Graphene board inspecting apparatus. ADVANTAGE - Time to inspect the graphene board, particularly graphene boards with large area layers, is reduced by using visible rays and wavelengths and including a beam splitter. Manufacturing time and cost are reduced since error in patterning the graphene board is immediately corrected when detected. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for graphene inspecting method. DESCRIPTION OF DRAWING(S) - The drawing shows the schematic diagram of the graphene board inspecting apparatus. Light processing unit (11) Graphene board inspecting apparatus (101) Transmittance detecting unit (121) Determination unit (131) Graphene board (301)