• 专利标题:   Graphene deposition process for deposition of graphene on substrates, involves generating radio frequency plasma at location proximate to substrate, while flowing precursor gas containing carbon through plasma and over substrate.
  • 专利号:   US2017253962-A1, US10151027-B2
  • 发明人:   CHEN Z, CHUGH S, MEHTA R
  • 专利权人:   PURDUE RES FOUND, PURDUE RES FOUND
  • 国际专利分类:   C23C016/02, C23C016/26, C23C016/505, H01J037/32, H01L021/02, H01L021/306, H01L029/16, C01B032/182, C01B032/186, C01B032/184
  • 专利详细信息:   US2017253962-A1 07 Sep 2017 C23C-016/26 201764 Pages: 23 English
  • 申请详细信息:   US2017253962-A1 US447065 01 Mar 2017
  • 优先权号:   US302361P, US447065

▎ 摘  要

NOVELTY - The graphene deposition process involves placing a substrate into a deposition chamber. The substrate is a metal, an insulator or a semiconductor. The chamber is heated to a temperature of 550-650 degrees Celsius. A radio frequency plasma is generated at a location proximate to the substrate while flowing a precursor gas containing carbon through the plasma and over the substrate. USE - Graphene deposition process for deposition of graphene on substrates. ADVANTAGE - The deposition process implements facile graphene integration into commercial devices, by reducing the growth temperature which increases the potential substrates and avoid the necessity of the transfer operation from a catalyst to the substrate. The deposition process uses higher temperatures which result in higher grain sizes which in turn result in a smaller number of grain boundaries, thus achieving a more efficient current density once the graphene is used in an electronic device. DESCRIPTION OF DRAWING(S) - The drawing shows the graphical view of a Raman spectroscopy output of intensity versus Raman shift which depicts different growth periods of graphene on silicon dioxide.