▎ 摘　　要

NOVELTY - Defects in graphene layer are labeled by providing substrate with surface partially covered by graphene layer and contacting substrate with indicator which selectively binds with greater than or equal to 1 areas exposed by defects in the graphene layer. USE - Labeling of defects in graphene layer for high volume and/or large area production of graphene films. ADVANTAGE - The systems and kits can provide a fast and effective way of checking for defects and/or labeling defects in the graphene layer, improving process control and quality assurance during production and handling of graphene films. DETAILED DESCRIPTION - INDEPENDENT CLAIMS are included for: (1) system for labeling defects in a graphene layer comprising substrate having a surface at least partially covered by graphene layer and 1st reservoir containing a solution of an indicator which selectively binds with greater than or equal to 1 areas of the surface exposed by the defects to label the defects and configured to contact the substrate with the solution of the indicator; (2) inspection of graphene layer for defects which involves providing substrate having a surface at least partially covered by graphene layer, contacting substrate with fluorophore which selectively binds with greater than or equal to 1 areas of the surface exposed by the defects in the graphene layer to label locations of the defects, exposing substrate to radiation effective to generate a detectable fluorescence response from the fluorophore at greater than or equal to 1 areas of the surface exposed by the defects, and monitoring the fluorescence response of the fluorophore; (3) system for inspecting graphene layer for defects comprising substrate having a surface at least partially covered by graphene layer, 1st reservoir containing solution of fluorophore which selectively binds with greater than or equal to 1 areas of the surface exposed by the defects and configured to contact the substrate with the solution of the fluorophore, radiation source configured to irradiate the substrate to generate a detectable fluorescence response from the fluorophore at greater than or equal to 1 areas of the surface exposed by the defects, and detector configured to monitor the fluorescence response of the fluorophore; (4) kit for labeling defects in a graphene layer on surface of a substrate comprising a fluorophore which selectively binds with greater than or equal to 1 areas of the surface exposed by the defects in the graphene layer to label the defects and a set of instructions for contacting the substrate with a solution of the fluorophore; (5) labeled sample comprising substrate having a surface at least partially covered by a graphene layer and fluorophore at greater than or equal to 1 areas of the surface exposed by the defects in the graphene layer to label the defects; and (6) pretreated sample comprising substrate having a surface at least partially covered by graphene layer and amino silane at greater than or equal to 1 areas of the surface exposed by the defects in the graphene layer to pretreat the greater than or equal to 1 of the surface for binding with a fluorophore. DESCRIPTION OF DRAWING(S) - The drawing shows a schematic diagram of the labeling of a surface of a substrate exposed by a defect in the graphene layer using a silane fluorophore.